SiriusXT was delighted to participate in Microscopy & Microanalysis 2026 (M&M 2026) in Milwaukee, one of the world’s leading gatherings for the microscopy and microanalysis community.

Across the week, we had the opportunity to meet researchers, facility managers, collaborators and industry colleagues at the SiriusXT booth, through our poster presentations and during our invited presentation on the growing role of laboratory Soft X-ray Tomography (SXT) in correlative and multimodal imaging workflows.

A recurring theme throughout the conference was the increasing need to understand biological structure across multiple length scales — from the context of intact cells, tissues and organoids through to molecular-level detail. This is driving growing interest in workflows that combine complementary imaging techniques, including fluorescence microscopy, Soft X-ray Tomography and electron microscopy.

For SiriusXT, M&M was therefore an excellent opportunity not only to demonstrate the capabilities of the SXT-100, but also to discuss how SXT can provide the larger-volume cellular context needed to complement the extraordinary resolution now achievable with cryo-electron microscopy and cryo-electron tomography.

We would particularly like to thank the many visitors who took the time to come to our booth, attend our presentation and visit our posters. We greatly appreciated the discussions, questions and ideas for new applications and collaborations.

Conferences such as M&M provide an invaluable opportunity to exchange ideas with the microscopy community and to better understand how imaging technologies need to evolve as biological research increasingly moves towards correlative imaging across scales.

Thank you to everyone who met with Kenneth Fahy, Sergey Kapishnikov and Tony McEnroe in Milwaukee. We look forward to continuing many of those conversations over the coming months.