For researchers imaging across scales – from tissues and tumours down to sub-cellular structures – traditional Correlative Light and Electron Microscopy (CLEM) workflows come with two critical limitations:
- They are painfully slow, and
- The sample destruction involved in preparing 150 nm lamella for cryo-TEM means over 95% of the sample is lost before it’s even imaged.
At SiriusXT, we’re helping to change that.
We’re excited to present our latest work on CLEXM – a novel imaging workflow that integrates Soft X-ray Tomography (SXT) into the cryo-CLEM pipeline. This non-destructive step allows researchers to pre-screen entire thick ‘slabs’ of their samples in 3D, capturing structural detail at nanoscale resolution before moving to cryo-TEM.
More context: Image >95% of your sample volume to guide ROI selection.
Higher throughput: Reduce time wasted on ‘blind’ cryo-sectioning.
Less sample loss: Preserve ultrastructural integrity until final targeting.
We’ll be showcasing our collaborative work with the Max Planck Institute, where we applied the CLEXM workflow to image the volume of a C. elegans worm, enabling the precise selection of just a few high-value targets for downstream cryo-TEM.
If you’re attending the Gordon Research Conference on volEM in Barcelona, drop by our poster session to see the results and discuss how CLEXM can transform your imaging workflows.
Check out our images gallery to learn more about the power of Soft X-ray Tomography!
