SiriusXT would like to thank Prof. Roland Fleck, Kings College London, for the very illuminating keynote presentation he gave on correlative imaging workflows at the M&M2024 conference in Cleveland last week.

His presentation entitled “Multi-scale Correlative Workflows, Challenges and Opportunities for cryo CLEM” elaborated on his experience in using SiriusXT’s soft X-ray microscope (the SXT-100) as a pre-screening tool to identify regions of interest in vitrified samples for subsequent cryo-TEM analysis, providing the opportunity to increase workflow throughput and efficiencies.

Check out the product page to learn more about the SXT-100.
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